The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
May. 14, 2021
Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, CN;
Yingjian Wang, Hefei, CN;
Dongfeng Shi, Hefei, CN;
Jian Huang, Hefei, CN;
Ke'e Yuan, Hefei, CN;
Linbin Zha, Hefei, CN;
Abstract
A centroid detection method based on a single-pixel detector, including: S: establishing a photoelectric detection and acquisition system, and generating three two-dimensional (2D) array matrices A, B and C; S: generating, by letting element value of each column in the matrix A be the corresponding serial number of the column, element value of each row in the matrix B be the corresponding serial number of the row, and element value of the matrix C be 1, 2D modulation information having distribution of the matrices A, B and C; S: modulating illumination light according to the mode of the 2D modulation information and projecting the illumination light to a target object or modulating, according to the mode of the 2D modulation information, an image formed by the target object; and S: acquiring intensity value of target reflected light to obtain position parameter of the target centroid.