The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jul. 07, 2023
Applicants:

SK Hynix Inc., Icheon, KR;

Seoul National University R&db Foundation, Seoul, KR;

Inventors:

Deog Kyoon Jeong, Seoul, KR;

Chan Ho Kye, Seoul, KR;

Ji Hee Kim, Seoul, KR;

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/317 (2006.01); H03K 3/037 (2006.01); H03K 5/00 (2006.01); H03K 19/20 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2851 (2013.01); G01R 31/31727 (2013.01); H03K 3/037 (2013.01); H03K 5/00006 (2013.01); H03K 19/20 (2013.01);
Abstract

Disclosed is a test aid unit that is installed between automatic test equipment (ATE) and a device under test (DUT), generates a test data signal according to a data processing and transmission/reception rate of the DUT in response to a control signal transmitted from the ATE, transmits the test data signal to the DUT, self-tests a test result signal transmitted from the DUT, and transmits the test result to the ATE. The test aid unit includes a clock signal divider, an integrated digital logic unit, a transmitter, and a receiver.


Find Patent Forward Citations

Jeong, Deog. (2025). Test aid units (U.S. Patent No. 12442853). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12442853

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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