The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Feb. 09, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jungmin Bak, Suwon-si, KR;

Junyoung Ko, Suwon-si, KR;

Changhwi Park, Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); G01R 19/165 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G01R 19/0038 (2013.01); G01R 19/16552 (2013.01); G11C 29/50004 (2013.01); G11C 2029/5004 (2013.01); G11C 2029/5006 (2013.01);
Abstract

A test device includes a power supply circuit that is configured to supply an input voltage through a power voltage pin to a memory device under test, and a test controller, which is configured to: (i) transmit a command signal to the memory device, (ii) measure a first current flowing to the memory device through the power voltage pin at a first time point after transmitting the command signal, (iii) measure a second current flowing to the memory device through the power voltage pin at a second time point, which is different from the first time point, and (iv) compare the measured first current to the measured second current to thereby determine whether the memory device has a defect therein.


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