The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Feb. 01, 2022
Applicant:

Wallac Oy, Turku, FI;

Inventors:

Joona-Pekko Kakko, Turku, FI;

Henna Päkkilä, Turku, FI;

Teemu Korpimäki, Turku, FI;

Mikko Sairanen, Turku, FI;

Ville Veikkolainen, Turku, FI;

Assignee:

WALLAC OY, Turku, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); C12N 5/073 (2010.01); G01N 33/50 (2006.01); G01N 33/76 (2006.01);
U.S. Cl.
CPC ...
G01N 33/76 (2013.01); C12N 5/0604 (2013.01); G01N 33/5005 (2013.01); G01N 33/54388 (2021.08);
Abstract

A lateral flow test strip reader for reading an output of a lateral flow assay to determine a presence or absence of a target in a sample includes: a housing having a lateral flow test strip receptacle for receiving a lateral flow test strip therein, the lateral flow test strip receptacle defining a test region and a control region for a lateral flow test strip; a light source that generates an excitation light beam; at least one lens for optically expanding the excitation light beam in a direction across the test region and the control region such that the excitation light beam is configured to simultaneously impinge and excite both the test region and the control region; and an optical detector configured to simultaneously detect an image comprising emission signals from the test region and the control region.


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