The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jul. 27, 2022
Applicant:

Lanzhou University, Lanzhou, CN;

Inventors:

Xiling Li, Lanzhou, CN;

Liang Qiao, Lanzhou, CN;

Jianbo Wang, Lanzhou, CN;

Assignee:

Lanzhou University, Lanzhou, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 22/00 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); G01R 27/2623 (2013.01);
Abstract

Disclosed is a single-ended test method for the wave-absorbing characteristic of a material. The device comprises a sample cavity, a microwave transmission rod, spring needles, an SMA joint and a vector network analyzer, wherein one end of the sample cavity is provided with a test fixture; the microwave transmission rod is arranged in the sample cavity and is connected with the test fixture in a penetrating mode; the spring needles are arranged in the microwave transmission rod; the SMA joint is arranged at the other end of the sample cavity; the receiving end of the vector network analyzer is electrically connected with a coaxial cable, and the other end of the coaxial cable is electrically connected with the other end of the SMA joint.


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