The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Feb. 18, 2022
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Kenichiro Ikemura, Hamamatsu, JP;

Kengo Suzuki, Hamamatsu, JP;

Kazuya Iguchi, Hamamatsu, JP;

Akihiro Nakamura, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9505 (2013.01); G01N 2201/065 (2013.01);
Abstract

A measuring device includes: an integrating sphere; an excitation optical system; a light detector; and a first detection optical system. The optical axis of the excitation light incident on the subject to be measured in the integrating sphere in the excitation optical system and the optical axis of the light to be measured that is emitted from the integrating sphere in the first detection optical system obliquely intersect with each other, the first detection optical system has an opening portion that limits a detection range of the light to be measured in the light detector, and an irradiation spot of the excitation light on the subject to be measured and the opening portion are in an optically conjugate relationship.


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