The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

May. 30, 2023
Applicant:

The Wave Talk, Inc., Daejeon, KR;

Inventors:

Young Dug Kim, Seongnam-si, KR;

Kyoung Man Cho, Seoul, KR;

Assignee:

THE WAVE TALK, INC., Daejeon, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 21/51 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4788 (2013.01); G01N 21/51 (2013.01); G01N 2021/479 (2013.01); G01N 2021/513 (2013.01);
Abstract

Provided is a turbidity meter including a main body, a fluid container which is formed inside the main body and in which a fluid is accommodatable, a fluid inlet pipe which is connected to the fluid container and via which the fluid is supplied to the fluid container, a fluid outlet pipe which is connected to the fluid container and via which the fluid is discharged from the fluid container to the outside, a wave source configured to irradiate waves toward the fluid container, a detector configured to detect a laser speckle at every time point set in advance, the laser speckle being generated due to multiple scattering of the irradiated waves in the fluid, and a controller configured to estimate the presence or absence of impurities in the fluid in real-time by using the detected laser speckle.


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