The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jan. 08, 2021
Applicant:

Essilor International, Charenton-le-Pont, FR;

Inventors:

Samy Hamlaoui, Charenton-le-Pont, FR;

Florian Caleff, Charenton-le-Pont, FR;

Stephane Gueu, Charenton-le-Pont, FR;

Arnaud Susset, Saint-Maur-des-Fosses, FR;

Fabien Muradore, Charenton-le-Pont, FR;

Ning Wang, Shanghai, CN;

Assignee:

Essilor International, Charenton-le-Pont, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0228 (2013.01); G01M 11/0221 (2013.01); G01M 11/0235 (2013.01); G01M 11/0257 (2013.01); G01M 11/0264 (2013.01);
Abstract

This method for retrieving at least one optical parameter of an ophthalmic lens comprises: obtaining an image of a first and second patterns by using an image capture device located at a first position; from that image, obtaining a first set of data from at least a part of the first pattern that is seen through the lens by the image capture device and obtaining a second set of data from at least a part of the second pattern that is seen directly i.e. outside the lens by the image capture device; retrieving the at least one optical parameter by using the first and second sets of data and taking account of relative positions of the image capture device, the lens and the first and second patterns.


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