The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Apr. 10, 2020
Applicant:

Cryovac, Llc, Charlotte, NC (US);

Inventors:

Honglei Li, Huntersville, NC (US);

Kalpit Shailesh Mehta, Charlotte, NC (US);

Solomon Bekele, Charlotte, NC (US);

Dewitt Jones, Greer, SC (US);

Marshall Hewitt, Charlotte, NC (US);

Assignee:

Cryovac, LLC, Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/38 (2006.01); G01N 21/88 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01M 3/38 (2013.01); G01N 21/8806 (2013.01); G01N 21/90 (2013.01);
Abstract

A process for monitoring seal quality of a packaging article. In one embodiment, the process for monitoring the seal quality includes sealing a film to form packaging article and forming a seal area. The seal area is analyzed by a vision system to acquire image data of the seal area. A vision inspection engine analyzes the image date to determine the continuity of the seal, the strength of the seal, or both.


Find Patent Forward Citations

Li, Honglei. (2025). System for in-line inspection of seal integrity (U.S. Patent No. 12442713). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12442713

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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