The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Jul. 23, 2021
Applicant:
Ifm Electronic Gmbh, Essen, DE;
Inventors:
Peter Kimbel, Tettnang, DE;
Manfred Maurus, Bad Waldsee, DE;
Fabian Kuhnhäuser, Ravensburg, DE;
Oliver Blankenhorn, Bodnegg, DE;
Assignee:
IFM Electronic GmbH, Essen, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01L 27/00 (2006.01); G01L 9/00 (2006.01); G01L 9/12 (2006.01); G01L 19/00 (2006.01); G01L 19/04 (2006.01);
U.S. Cl.
CPC ...
G01L 27/007 (2013.01); G01L 9/0072 (2013.01); G01L 19/0092 (2013.01);
Abstract
The invention relates to a method for monitoring the function of a capacitive pressure measuring cell () comprising a measuring capacitor (C) and a reference capacitor (C) as well as a temperature element, wherein a pressure measurement value p is obtained by forming the quotient Q from the capacitance values of the reference capacitor (C) and the measuring capacitor (C). The method is characterized by the following method steps: