The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Dec. 06, 2021
Nederlandse Organisatie Voor Toegepast-natuurwetenschappelijk Onderzoek Tno, 's-Gravenhage, NL;
Gerard Christiaan Jurjen Otter, Pijnacker, NL;
James Peter Robert Day, Berkel en Rodenrijs, NL;
Niels Dijkhuizen, Zoetermeer, NL;
Ralph Claude Snel, Hilversum, NL;
Marcela Pelica Pascoa, Eindhoven, NL;
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO, 's-Gravenhage, NL;
Abstract
A method and device () for making a calibrated measurement of light from an object (E). In a first measurement window (W), object light (L) is received from the object (E) onto a beam splitter () which splits the light into a signal path (Ps) and a reference path (Pr). A first signal (S=T·L·Hs) is measured by a signal detection element () in the signal path (Ps). A second signal (S=R·L·Hr) is measured by a reference detection element () in the reference path (Pr). In a second measurement window (W), calibration light (L) is received onto the beam splitter (). A third signal (S=R·L·Hs) is measured by the signal detection element () in the signal path (Ps). A fourth signal (S=T·L·Hr) is measured by the reference detection element () in the reference path (Pr). A measurement value of the object light (L) is determined based on the measured signals (S,S,S,S).