The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Nov. 01, 2022
Applicant:

Bp Corporation North America Inc., Houston, TX (US);

Inventors:

Adrian O'Neill, London, GB;

Casey Denny, Houston, TX (US);

Jeremy Eade, Houston, TX (US);

Chunlei Chu, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 44/00 (2006.01); E21B 41/00 (2006.01);
U.S. Cl.
CPC ...
E21B 44/00 (2013.01); E21B 41/00 (2013.01);
Abstract

A method for planning a subject well includes receiving a well profile for the subject well, the well profile comprising a plurality of sets of attributes, each corresponding to one of a plurality of depths of the subject well; categorizing each of the sets of attributes as being in a first zone or in a second zone to generate a pivoted well profile, where the pivoted well profile includes a number of the sets of attributes in the first zone and a number of the sets of attributes in the second zone; comparing the pivoted well profile of the subject well to a library of well profiles; identifying, based on the comparison, an analog well from the library, where a difference between the analog well profile and the pivoted well profile is less than a threshold; and providing an indication of the identified analog well.


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