The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Sep. 12, 2022
Applicant:

Board of Regents, the University of Texas System, Austin, TX (US);

Inventors:

Nicholas R. Gans, Plano, TX (US);

Bashir H. Jafari, Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01); B41J 3/407 (2006.01); G06K 15/02 (2006.01); G06T 17/00 (2006.01); H04N 1/387 (2006.01);
U.S. Cl.
CPC ...
B41J 2/04586 (2013.01); B41J 2/04593 (2013.01); B41J 3/4073 (2013.01); G06K 15/1868 (2013.01); G06T 17/00 (2013.01); H04N 1/387 (2013.01); B41J 2202/21 (2013.01);
Abstract

In an embodiment, a method for controlling a printer is provided. The method includes: receiving a set of parameters associated with a printer by a computing device, wherein the printer is depositing ink on a substrate to generate a line; measuring a width of the line by the computing device; receiving a duty cycle associated with the printer by the computing device; using the received duty cycle, the set of parameters, and a model, estimating one or more unknown parameters of the set of parameters by the computing device; receiving a desired width of the line by the computing device; and if the desired width is not the same as the measured width: adjusting the duty cycle associated with the printer based on the set of parameters and the model so that the measured width is closer to the desired width by the computing device.


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