The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jan. 21, 2022
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Kennosuke Hayashi, Kyoto, JP;

Yohei Okawa, Kyoto, JP;

Yoshihisa Ijiri, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1664 (2013.01); B25J 9/1697 (2013.01);
Abstract

The observation update unit increases a weight of a particle for a particle representing a position and a posture closer to a position and a posture of an operation object indicated by an observation result, and increases a weight of a corresponding particle for a particle closer to a state in which an object of interest and the operation object arranged in a position and a posture represented by each of particles are in contact with each other in a virtual space where shapes and a relative positional relationship of the object of interest and the operation object are expressed in a case in which the observation result indicates that the contact has occurred.


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