The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Jun. 07, 2021
Applicant:

Addup, Cebazat, FR;

Inventors:

Antoine Anneton, Cebazat, FR;

Raphael Vernet, Cebazat, FR;

Assignee:

ADDUP, Cebazat, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 10/366 (2021.01); B22F 10/85 (2021.01); B22F 12/30 (2021.01); B22F 12/90 (2021.01); B22F 10/28 (2021.01); B33Y 30/00 (2015.01); B33Y 40/00 (2020.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B22F 10/31 (2021.01); B22F 10/366 (2021.01); B22F 10/85 (2021.01); B22F 12/30 (2021.01); B22F 12/90 (2021.01); B22F 10/28 (2021.01); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

A removable calibration plate () comprises a sheet () comprising an upper face () intended to face towards the powerful incident-radiation beam, and bearing a reference marking () and being intended to receive a test marking (), and a lower face (). The plate () comprises an etching layer () to be etched by a powerful incident-radiation beam (F), this layer being secured to the upper face () of the sheet () and opaque to visible light, and being able to be destroyed locally by the powerful incident-radiation beam (F) in order to form the at least one test marking (), the sheet () being transparent to visible light, the lower face () of the sheet () being frosted.


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