The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
May. 28, 2021
Applicant:
Welch Allyn, Inc., Skaneateles Falls, NY (US);
Inventors:
John A. Lane, Weedsport, NY (US);
Carlos Suarez, Syracuse, NY (US);
Rachel K. Douglas, Latrobe, PA (US);
Matthew D. Mullin, Memphis, NY (US);
Assignee:
Welch Allyn, Inc., Skaneateles Falls, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/01 (2006.01);
U.S. Cl.
CPC ...
A61B 5/01 (2013.01); A61B 5/0035 (2013.01); A61B 5/0077 (2013.01); A61B 5/743 (2013.01);
Abstract
A screening method includes controlling a heat source of a screening device to reach a selected temperature, determining a location of a subject, and determining that the location is a desired distance from the screening device. The method also includes based at least in part on determining that the location is the desired distance from the screening device, simultaneously determining a temperature of the subject and a temperature of the heat source using a temperature sensor of the screening device.