The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Mar. 16, 2022
Applicant:

Hua Hong Semiconductor (Wuxi) Limited, Wuxi, CN;

Inventors:

Liusuo Cheng, Wuxi, CN;

Guanglong Chen, Wuxi, CN;

Han Wang, Wuxi, CN;

Jiliang Zhang, Wuxi, CN;

Jiangyong Qian, Wuxi, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10F 39/00 (2025.01); H10F 39/18 (2025.01);
U.S. Cl.
CPC ...
H10F 39/8063 (2025.01); H10F 39/18 (2025.01); H10F 39/8037 (2025.01); H10F 39/807 (2025.01); H10F 39/811 (2025.01);
Abstract

A CMOS image sensor, a first dielectric layer is formed on a first surface of a semiconductor substrate, and a plurality of lower microlenses having a bottom surface in the shape of an arc concave structure and located directly above the corresponding photodiode are formed in the first dielectric layer. A plurality of upper microlenses having a top surface in the shape of an arc convex structure and located directly above the corresponding lower microlens are formed on the top surface of the first dielectric layer. The refractive index of the material of the upper microlens is greater than or equal to the refractive index of the material of the lower microlens, and the refractive index of the material of the lower microlens is greater than the refractive index of the first dielectric layer.


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