The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Aug. 25, 2021
Application, services, and network slice based measurements for minimization of drive test reporting
Qualcomm Incorporated, San Diego, CA (US);
Rajeev Kumar, San Diego, CA (US);
Ozcan Ozturk, San Diego, CA (US);
Xipeng Zhu, San Diego, CA (US);
Shankar Krishnan, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
In some wireless communications systems, devices may support minimization of drive test (MDT) reporting, quality of service (QoS) reporting, and quality of experience (QoE) measurements. A user equipment (UE) and the serving base station may obtain measurements in accordance with a measurement configuration that indicates various triggering events or reporting adjustment factors associated with the measurements. The measurement configuration may indicate a triggering event such as the start of an application or service at the UE, and the UE may obtain MDT or QoE measurements based on identifying the application or service. Additionally, the serving base station may obtain MDT and QoE measurements based on identifying the application and service or a notification from the UE. The UE and the serving base station may identify reporting adjustment factors based on network slicing, area configurations and times of the day affecting the reporting interval and reporting amount for the measurement report.