The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Sep. 15, 2023
Realtek Semiconductor Corp., Hsinchu, TW;
Ming-Sheng Peng, Hsinchu, TW;
Ting-Ying Wu, Hsinchu, TW;
Shih-Hung Wang, Hsinchu, TW;
Wei-Zhi Chen, Hsinchu, TW;
REALTEK SEMICONDUCTOR CORP., Hsinchu, TW;
Abstract
A signal quality optimization system and a signal quality optimization method are provided. The method includes: executing a ZQ calibration process on an off-chip driver (OCD) circuit of a first circuit and an on-die termination (ODT) circuit of a second circuit to obtain calibrated resistor quantities; performing a waveform test process, including: setting a predetermined time rule to determine an operation success condition, adjusting the OCD circuit according to the calibration calibrated quantity corresponding to a target ODT resistance, obtaining a signal eye diagram, and obtaining an adjustable resistor ratio by performing adjustments and tests; extracting the OCD resistance value with the highest adjustable resistor ratio to obtain preferred ODT-OCD resistance combinations; and configuring the ODT circuit and the OCD circuit according to the preferred ODT-OCD resistance combinations, and testing the preferred ODT-OCD resistance combinations to obtain an optimized ODT-OCD resistance combination according to test results.