The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Mar. 10, 2022
Sysmex Corporation, Kobe, JP;
Shoichiro Asada, Kobe, JP;
Konobu Kimura, Kobe, JP;
Masamichi Tanaka, Kobe, JP;
Kenichiro Suzuki, Kobe, JP;
SYSMEX CORPORATION, Kobe, JP;
Abstract
Disclosed is an analysis method for a specimen using an analyzer connected to a host computer, the analysis method including: obtaining, with respect to each of a plurality of cells contained in the specimen, feature data of the cell; generating classification information in which each of the cells is classified into a plurality of cell types, by analyzing the feature data with use of an artificial intelligence algorithm and performing classifying; generating a measurement result of the specimen on the basis of the classification information; displaying, on a display part of the analyzer, the measurement result and at least a part of the classification information; and transmitting, to the host computer, output data that includes the measurement result and in which at least a part of the classification information has been removed.