The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Mar. 18, 2022
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Xiaoning Wang, Shenzhen, CN;

Jianhua Yao, Shenzhen, CN;

Hong Shang, Shenzhen, CN;

Han Zheng, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/00 (2022.01); G06V 10/22 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06V 10/225 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01); G06V 2201/03 (2022.01); G06V 2201/07 (2022.01);
Abstract

An image analysis method includes: obtaining an image; performing image classification on the image by using an image classification network, to obtain an image classification result of an image category of the image, the image category including a first category and a second category different from the first category; performing object detection on the image by using an object detection network, to obtain an object detection result of a target object associated with the first category; and generating an image analysis result of the image based on the image classification result and the object detection result.


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