The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Apr. 24, 2020
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Shoji Yachida, Tokyo, JP;
Keiko Inoue, Tokyo, JP;
Azusa Sawada, Tokyo, JP;
Toshinori Hosoi, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/90 (2006.01); G06T 7/00 (2017.01); G06T 7/20 (2017.01);
U.S. Cl.
CPC ...
G06T 7/20 (2013.01); G01N 21/90 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20021 (2013.01);
Abstract
A determination apparatus includes: a dividing unit configured to divide chronological image data acquired by imaging a liquid filled in a container while switching between a plurality of illumination conditions, into chronological image data corresponding to the illumination conditions; and a determining unit configured to determine foreign matter contained in the container based on each of the chronological image data obtained by division by the dividing unit.