The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Apr. 07, 2025
Qilu Hospital of Shandong University (Qingdao), Qingdao, CN;
Haiguang Zhao, Qingdao, CN;
Ziqi Wang, Qingdao, CN;
QILU HOSPITAL OF SHANDONG UNIVERSITY, (QINGDAO) Qingdao, CN;
Abstract
The present disclosure relates to the technical field of image processing, in particular to a machine vision-based method for rapidly detecting a scar contour, including: collecting to-be-detected neck images of a number of persons; obtaining a scar color difference salient degree and a scar brightness difference salient degree of each superpixel block according to a distribution difference situation of L-channel values and a-channel values among different superpixel blocks; obtaining a contour similarity degree of each superpixel block according to a correlation influence situation between the scar brightness difference salient degree and the scar color difference salient degree of the superpixel block, and a b-channel value of each pixel point; and performing scar contour detection according to the contour similarity degree. The present disclosure improves accuracy of a scar detection result and improves efficiency of rapidly detecting the scar contour.