The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Oct. 17, 2022
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Li Zhang, Beijing, CN;
Xin Jin, Beijing, CN;
Hongkai Yang, Beijing, CN;
Xiaofei Xu, Beijing, CN;
Zhenhua Zhao, Beijing, CN;
Siyuan Zhang, Beijing, CN;
Changyu Chen, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
The present disclosure relates to an imaging system and method for radiographic inspection. The imaging system for radiographic inspection includes an inspection area including an imaging area; a first ray source assembly, all the first targets of which are arranged in a first ray source plane; a first detector assembly, the plurality of first detector units of which are arranged in a detector plane, the detector plane and the first ray source plane are spaced apart from each other in a travelling direction of the object under inspection with a predetermined distance; and a ray source control device, configured such that when the region of interest of the object under inspection is at least partially located in the imaging area, the first ray source assembly emits X-rays simultaneously from at least two first targets to the imaging area at the same time.