The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Aug. 25, 2021
Applicant:

Goertek Optical Technology Co., Ltd, Shandong, CN;

Inventors:

Xiufeng Song, Shandong, CN;

Yifan Zhang, Shandong, CN;

Jie Liu, Shandong, CN;

Wenchao Zhang, Shandong, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G06T 2207/30164 (2013.01);
Abstract

A screen defect detection method and apparatus and an electronic device are disclosed. The method comprises the following steps: identifying a number of suspected defective pixel points(S) from a detection image of a target screen; determining a suspected defect region(S) corresponding to a suspected defective pixel point in the detection image; dividing the suspected defect region into a general region and a core region(S); and judging whether the target screen has a transparent defect(S) according to a mean gray value of the suspected defect region, a mean gray value of the general region and a minimum gray value of the core region.


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