The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
May. 10, 2021
Volume Graphics Gmbh, Heidelberg, DE;
Matthias Flessner, Heidelberg, DE;
Patrick Fuchs, Heidelberg, DE;
VOLUME GRAPHICS GMBH, Heidelberg, DE;
Abstract
Described is a computer-implemented method for optimising a determining of measurement data of an object, where the measurement data is evaluated for geometrical characteristics of the object. The measurement data is determined by measuring the object using at least one recording parameter that includes at least one measurement geometry and/or at least one adjusting option for the measurement. The method includes the following steps: determining at least one measuring task for the object, wherein the measuring task is carried out by an evaluation method and it establishes the geometrical characteristics of the object; optimising the at least one recording parameter for the at least one measuring task for optimising the determining of measurement data; determining the measurement data for the object by measuring using the at least one optimised recording parameter; and carrying out the at least one measuring task for the object based on the determined measurement data.