The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
May. 22, 2023
Anhui Nio Autonomous Driving Technology Co., Ltd., Hefei, CN;
Guanghui Ren, Shanghai, CN;
Huan Qin, Shanghai, CN;
Xindong He, Shanghai, CN;
Qi Xiong, Shanghai, CN;
Chao Peng, Shanghai, CN;
Abstract
The disclosure relates to the technical field of autonomous driving, and specifically provides a target detection method, a computer device, a computer-readable storage medium, and a vehicle, to solve the problem of detecting a target in a timely and accurate manner. For this purpose, the method of the disclosure includes: rasterizing point cloud space of three-dimensional point clouds in a vehicle driving environment to form a plurality of three-dimensional point cloud grids, and using point cloud grids including three-dimensional point clouds as target point cloud grids; determining a convolution dilation rate based on sparsity of the target point cloud grid; dilating a sparse convolution based on the convolution dilation rate; extracting a point cloud grid feature of the target point cloud grid by using a dilated sparse convolution; weighting the point cloud grid feature by using an attention mechanism to obtain a global point cloud feature; and performing target detection based on the global point cloud feature. In this way, both a remote target and a close target can be accurately detected. In addition, using the sparse convolution for detection can reduce the calculation amount and improve the detection efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile