The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Dec. 20, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hiroki Sugegaya, Tokyo, JP;

Shunsuke Tsuda, Tokyo, JP;

Ning Li, Tokyo, JP;

Yuki Tsuruoka, Tokyo, JP;

Shuta Okada, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 20/20 (2012.01); G06T 7/20 (2017.01); G06V 40/20 (2022.01);
U.S. Cl.
CPC ...
G06Q 20/208 (2013.01); G06T 7/20 (2013.01); G06V 40/28 (2022.01); G06T 2207/30242 (2013.01);
Abstract

A detection system according to an aspect of the present disclosure includes: at least one memory configured to store instructions; and at least one processor configured to execute the instructions to: acquire a number of one or more products to be registered based on an image in which a customer reads one or more product symbols with a scanner; acquire a number of one or more products registered by the customer; detect discrepancy between the number of the one or more products to be registered and the number of the one or more registered products; and output a detection result.


Find Patent Forward Citations

Sugegaya, Hiroki. (2025). Detection system, detection method, and storage medium (U.S. Patent No. 12437284). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12437284

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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