The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Dec. 16, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Younghoon Kim, Suwon-si, KR;

Sungsu Kim, Suwon-si, KR;

Jungmin Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/084 (2023.01); G06N 3/044 (2023.01); G06N 3/08 (2023.01); G06T 5/50 (2006.01); G06T 5/60 (2024.01); G06T 5/70 (2024.01); G06T 5/92 (2024.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06N 3/084 (2013.01); G06N 3/044 (2023.01); G06N 3/08 (2013.01); G06T 5/50 (2013.01); G06T 5/60 (2024.01); G06T 5/70 (2024.01); G06T 5/92 (2024.01); G06T 7/97 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A method of predicting optimal values for a plurality of parameters used in an operation of an image signal processor includes: inputting initial values for the plurality of parameters to a machine learning model having an input layer, corresponding to the plurality of parameters, and an output layer corresponding to a plurality of evaluation items extracted from a result image generated by the image signal processor; obtaining evaluation scores for the plurality of evaluation items using an output of the machine learning model; adjusting weights, applied to the plurality of parameters, based on the evaluation scores; and determining the optimal values using the adjusted weights.


Find Patent Forward Citations

Loading…