The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Mar. 05, 2020
Applicant:

Stmicroelectronics (Rousset) Sas, Rousset, FR;

Inventors:

Pierre Demaj, Nice, FR;

Laurent Folliot, Gourdon, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/04 (2013.01); G06N 3/08 (2013.01);
Abstract

In accordance with an embodiment, a method includes reducing a size of at least one initial parameter of each layer of an initial multilayer neural network to obtain for each layer a set of new parameters defining a new neural network, wherein each new parameter of the set of new parameters has its data represented in two portions comprising an integer portion and a fractional portion; implementing the new neural network using a test input data set applied only once to each layer; determining a distribution function or a density function resulting from the set of new parameters for each layer; and based on the determined distribution function or density function, adjusting a size of a memory area allocated to the fractional portion and a size of the memory area allocated to the integer portion of each new parameter associated with each layer.


Find Patent Forward Citations

Demaj, Pierre. (2025). System and method for modifying integer and fractional portion sizes of a parameter of a neural network (U.S. Patent No. 12437180). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12437180

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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