The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Mar. 29, 2024
International Business Machines Corporation, Armonk, NY (US);
Jeffrey Willoughby, Poughkeepsie, NY (US);
Milcah Ntende, Poughkeepsie, NY (US);
Donald Thomas, Hopewell Junction, NY (US);
Emily Wise, Beacon, NY (US);
John R. Dangler, Rochester, MN (US);
Kevin Randolph, Wurtsboro, NY (US);
Andrew C.m. Hicks, Highland, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
In accordance with a technique of parallelized computer system testing, a processor develops, on a representative computer system, a plurality of groups of system tests based on test-ordering constraints, where the system tests in each of the plurality of groups are executable in a temporally overlapping manner. The processor applies a test suite including a sequence of multiple of the plurality of groups of system tests to a production computer system. Applying the test suite includes performing the system tests in each of multiple of the plurality of tests groups in a temporally overlapping manner, such that testing efficiency is improved.