The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Jan. 26, 2022
International Business Machines Corporation, Armonk, NY (US);
Wu Song Fang, Beijing, CN;
Xin Zheng, Beijing, CN;
Ji Dong Li, BeiJing, CN;
Shan Shan Cai, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An objective-driven test case generation system includes an atomic test case module, a test data module, a tailoring module and a functional test case module. The atomic test case module generates a plurality of atomic test cases and stores the atomic test cases in an atomic test case library. The test data module receives a business model, determines one or more test steps from the input business model, and generates test data including the test steps. The tailoring module performs a linking operation to link the test steps included in the test data with one or more atomic test cases included in the atomic test case library to generate linked test case data. The functional test case module generates an objective-driven functional test case based on the linked test case data.