The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Jul. 26, 2023
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Zhengzhang Chen, Princeton Junction, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Liang Tong, Lawrenceville, NJ (US);
Dongjie Wang, Orlando, FL (US);
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01); G06F 11/076 (2013.01); G06F 11/3447 (2013.01);
Abstract
A computer-implemented method for detecting trigger points to identify root cause failure and fault events is provided. The method includes collecting, by a monitoring agent, entity metrics data and system key performance indicator (KPI) data, integrating the entity metrics data and the KPI data, constructing an initial system state space, detecting system state changes by calculating a distance between current batch data and an initial state, and dividing a system status into different states.