The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Jan. 07, 2025
Nanhu Laboratory, Jiaxing, CN;
Lei Zhang, Jiaxing, CN;
Nanhu Laboratory, Jiaxing, CN;
Abstract
Provided is a novel method of measuring a confidential computing application layer and a system thereof. The method includes: utilizing characteristic of static measurement of an existing underlying component of confidential computing at a virtual machine level to realize the trusted measurement of a trigger module TG_APP at an underlying measurement level; utilizing the TG_APP which is subjected to the trusted measurement to carry out the trusted measurement of a user-mode application; and utilizing the trusted TG_APP which is measured by a confidential computing chip layer to realize the trusted measurement of the application layer. The method not only avoids the problem of a huge amount of measurement of confidential computing, but also realizes the measurement of the accurate application of the application layer, which well solves the problem of measurement of the confidential computing application layer based on a virtual machine.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile