The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Dec. 09, 2021
Applicant:
Hexagon Technology Center Gmbh, Heerbrugg, CH;
Inventors:
Jürg Hinderling, Marbach, CH;
Andreas Walser, St. Gallen, CH;
Tim Mayer, Widnau, CH;
Hannes Beyer, Romanshorn, CH;
Oliver Rohrer, Lindau, DE;
Assignee:
HEXAGON TECHNOLOGY CENTER GMBH, Heerbrugg, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G01B 11/30 (2006.01); G01S 17/89 (2020.01); G02B 26/10 (2006.01); G02B 27/30 (2006.01);
U.S. Cl.
CPC ...
G02B 26/0875 (2013.01); G01B 11/30 (2013.01); G01S 17/89 (2013.01); G02B 26/10 (2013.01); G02B 27/30 (2013.01);
Abstract
Method and opto-electronic measuring device for measuring of an object's surface with a measuring rate of at least one thousand object points per second. Using a high-speed autofocus optical module comprising at least one variable focal length lens or reconfigurable optical phase plate having a response time of under 1 ms, situated in an emitting beam path, there is a real-time focus adaption of the measurement beam within a single object point measurement period.