The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Sep. 06, 2021
Flying-over beam pattern scanning hologram microscope device using scan mirror and translation stage
Cubixel Co., Ltd., Seoul, KR;
Tae Geun Kim, Seoul, KR;
Tae Woong Kim, Gwangju-si, KR;
Seung Ram Lim, Seoul, KR;
Kyung Beom Kim, Seoul, KR;
Eung Joon Lee, Seoul, KR;
Dong Hwan Im, Seoul, KR;
CUBIXEL CO., LTD., Seoul, KR;
Abstract
A flying-over beam pattern scanning hologram microscope device includes: a scan beam generation unit which converts a first beam and a second beam to a first spherical wave and a second spherical wave, and then allows the first and second spherical waves to interfere with each other to form a scan beam; a scanning unit, which comprises a scan mirror for controlling the scan beam in the horizontal direction, and a translation stage for moving an object in the vertical direction at the rear end of the projection unit; the projection unit projecting the scan beam onto an object plane; and a light collection unit for detecting a beam that has passed through the objective lens again after fluorescing or being reflected from an object.