The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Jul. 02, 2023
Applicant:

Evident Corporation, Nagano, JP;

Inventors:

Tadashi Hirata, Nagano, JP;

Shintaro Takahashi, Nagano, JP;

Assignee:

Evident Corporation, Nagano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/18 (2006.01); G02B 3/06 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01); G02B 3/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/18 (2013.01); G02B 3/06 (2013.01); G02B 21/26 (2013.01); G02B 21/362 (2013.01); G02B 21/367 (2013.01); G02B 2003/0093 (2013.01);
Abstract

An observation system includes a mounting table on which a sample container is placed, a surface light source that is disposed in one of two regions divided by the mounting table and has a light emitting plane, an observation optical system disposed in the other thereof, a conveyance mechanism moving the observation optical system in a direction orthogonal to an optical axis of the observation optical system to change an observation position, and a controller controlling a light emission pattern defined by a light emitting region where light is emitted on the light emitting plane. The controller executes first light emission pattern control in which the light emission pattern is changed according to the observation position, or, alternatively, second light emission pattern control in which the light emission pattern is switched between a plurality of periodic light emission patterns having phases different from each other.


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