The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
May. 05, 2022
Faro Technologies, Inc., Lake Mary, FL (US);
Oliver Zweigle, Stuttgart, DE;
Mark Brenner, Asperg, DE;
Aleksej Frank, Kornwestheim, DE;
Ahmad Ramadneh, Kornwestheim, DE;
FARO Technologies, Inc., Lake Mary, FL (US);
Abstract
A method for performing a simultaneous location and mapping of a scanner device in a surrounding environment includes capturing a scan-data of a portion of a map of the surrounding environment. The scan-data comprises a point cloud. Further, at runtime, a user-interface is used to make, a selection of a feature from the scan-data, and a selection of a submap that was previously captured. The submap includes the same feature. The method further includes determining a first scan position as a present position of the scanner device, and determining a second scan position as a position of the scanner device. The method further includes determining a displacement vector for the map based on the first and the second scan positions. Further, a revised first scan position is computed based on the second scan position and the displacement vector. The scan-data is registered using the revised first scan position.