The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Dec. 01, 2021
Applicant:

Infineon Technologies Austria Ag, Villach, AT;

Inventors:

Andreas Hofbauer, Zwettl, AT;

Marcus Edward Hennecke, Graz, AT;

Boris Kirillov, Judendorf-Straßenge, AT;

Rainer Reichert, Horn, AT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G02B 26/08 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4817 (2013.01); G02B 26/0833 (2013.01); G02B 26/101 (2013.01);
Abstract

A light scanning system includes a transmitter configured to transmit a transmit light beam along a transmission path; a microelectromechanical system (MEMS) mirror arranged on the transmission path and configured to oscillate about a first scanning axis to steer the transmit light beam in a first dimension; a macro scanner arranged on the transmission path and on a receiver path, the macro scanner configured to rotate about a second scanning axis to steer the transmit light beam in a second dimension, where the macro scanner is further configured to receive a receive light beam that is produced from the transmit light beam via backscattering, and where the macro scanner is configured to direct the receive light beam further along the receiver path; and a photodetector configured to receive the receive light beam from the macro scanner and generate a measurement signal representative of the receive light beam.


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