The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Jun. 27, 2025
Applicant:

Harbin Institute of Technology, Harbin, CN;

Inventors:

Shengxin Lin, Harbin, CN;

Yi Li, Harbin, CN;

Yuyang Bai, Harbin, CN;

Guodong Xia, Harbin, CN;

Shidong Shao, Harbin, CN;

Jiahong Yang, Harbin, CN;

Donghua Pan, Harbin, CN;

Liyi Li, Harbin, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01); G01R 33/00 (2006.01); G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
G01R 33/12 (2013.01); G01R 33/0076 (2013.01); G01R 33/0094 (2013.01); G01R 33/02 (2013.01);
Abstract

Provided is a magnetic moment measurement system and method, which belong to the technical field of magnetic moment measurement, and solve the problems of insufficient accuracy, low efficiency, and vulnerability to disturbance from an external magnetic field in the existing magnetic moment measurement technique. The magnetic moment measurement method includes the following steps: acquiring a magnetic field vector and a magnetic gradient tensor at a center of a magnetic sensor array through the magnetic sensor array; calculating an angle of a magnetic moment vector; and according to the angle of the magnetic moment vector, selecting a corresponding magnetic moment inversion formula, and calculating the magnetic moment vector. By constructing the magnetic sensor array, and using the advanced inversion algorithm, this application not only significantly improves the magnetic moment measurement accuracy, but also greatly shortens the measurement cycle, simplifies the measurement system, and reduces the measurement error.


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