The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Oct. 22, 2024
Applicant:

Zhejiang University, Hangzhou, CN;

Inventors:

Ying Huang, Hangzhou, CN;

Guoteng Wang, Hangzhou, CN;

Zheng Xu, Hangzhou, CN;

Assignee:

ZHEJIANG UNIVERSITY, Hangzhou, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2020.01);
U.S. Cl.
CPC ...
G01R 31/40 (2013.01);
Abstract

A method and system for evaluating strength of a voltage source converter (VSC)-penetrated power grid based on voltage stiffness are provided. First data corresponding to a to-be-analyzed power grid is acquired in real time, and processed to generate a first admittance matrix corresponding to the to-be-analyzed power grid. The first admittance matrix is processed to generate device impedance data of each VSC and a second admittance matrix corresponding to the to-be-analyzed power grid. Rows and columns where a grid-forming VSC node and a rated alternating-current (AC) bus voltage grid-following VSC node are located are removed from the second admittance matrix to generate a third admittance matrix, which is processed to generate second data and third data corresponding to the VSC node. Strength evaluation data corresponding to the to-be-analyzed power grid is generated based on the third data in combination with the second data.


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