The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Apr. 13, 2021
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Yuuki Kurokawa, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/327 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3278 (2013.01);
Abstract

A monitoring device monitors an abnormality in number of times of repetition of opening/closing of an output signal of a relay, and identifies a cause of the abnormality if the abnormality in number of times of repetition of opening/closing of the output signal of the relay is detected. This monitoring device includes an output signal monitoring unit that monitors an abnormality in number of times of repetition of opening/closing of an output signal of a relay, and a cause identification unit that identifies a cause based on periodicity of repetition of opening/closing if the output signal monitoring unit has detected an abnormality in number of times of repetition of opening/closing. The relay is opened/closed based on a control signal received from a numerical control device, and the cause identification unit may determine occurrence of an abnormality in the control signal if periodicity of repetition of opening/closing is detected.


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