The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Sep. 08, 2023
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Electronic Devices & Storage Corporation, Tokyo, JP;

Inventor:

Tomoyuki Maekawa, Fujisawa Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318552 (2013.01); G01R 31/31727 (2013.01);
Abstract

According to one embodiment, a circuit includes: a core circuit including first and second scan layers; and a test control circuit that controls a scan test on the first and second scan layers. The test control circuit supplies a first test data and a first shift clock to the first scan layer and then sets the first scan layer to a waiting state, supplies a second test data and a second shift clock to the second scan layer during a period in which the first scan layer is in the waiting state, sets the second scan layer to a waiting state after supplying the second test data and the second shift clock to the second scan layer, and supplies a first launch clock and a first capture clock to the first scan layer after setting the second scan layer to the waiting state.


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