Measurement pattern, measurement pattern set, calculation method, non-transitory computer-readable recording medium and calculation device

Abstract

The present disclosure relates to a measurement pattern for measuring a high frequency characteristic of a first element including a first input electrode, a first output electrode, and a first reference electrode. The measurement pattern includes a second element including a second input electrode having a planar shape corresponding to a planar shape of the first input electrode, a second output electrode having a planar shape corresponding to a planar shape of the first output electrode, and a second reference electrode overlapping the second input electrode and the second output electrode, an input pad connected to the second input electrode, an output pad connected to the second output electrode, and a reference pad connected to the second reference electrode, provided from the input pad to the output pad when viewed from a first direction, and having a planar shape linearly symmetric with respect to a virtual straight line.