The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Aug. 29, 2023
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Masataka Midori, Tokyo, JP;

Tomohiro Honya, Tokyo, JP;

Hiroshi Kurihara, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0892 (2013.01); G01R 29/0878 (2013.01);
Abstract

A computer-readable medium capable of estimating a distribution of an electromagnetic field intensity of radiant interference waves on a virtual surface surrounding a test piece with high accuracy while inhibiting an increase of a time required for a radiant interference wave test for radiant interference waves having a frequency included in a wider frequency band is provided. A computer-readable medium storing instructions which, when executed by a computer, cause the computer to execute a first calculation step of calculating an upper limit value of a measurement interval of radiant interference waves using an antenna based on positions of a plurality of electromagnetic wave sources according to a test piece radiating the radiant interference waves and a relative positional relation between the antenna measuring the radiant interference waves and the test piece.


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