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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12436159 B1

PDFFull Text
Date of Patent:
Oct. 07, 2025

Filed:

Oct. 07, 2020

Automatic analysis device

Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Takahiro Ando, Tokyo, JP;

Sakuichiro Adachi, Tokyo, JP;

Yasuhiro Keta, Tokyo, JP;

Yuya Matsuoka, Tokyo, JP;

Hiromitsu Mori, Tokyo, JP;

Shin Imamura, Tokyo, JP;

Eiichiro Takada, Tokyo, JP;

Makoto Arai, Tokyo, JP;

Assignee:

HITACHI HIGH-TECH CORPORATION, Tokyo, JP;

Attorney:

Volpe Koenig

Primary Examiner:

Jennifer Wecker

Assistant Examiner:

Oyeleye Alexander Alabi

Int. Cl.
CPC ...
B01L 3/00 (2006.01); B01D 15/08 (2006.01); B01F 33/302 (2022.01); B01F 33/3033 (2022.01); B01L 7/00 (2006.01); B01L 9/00 (2006.01); B65G 47/80 (2006.01); B82Y 20/00 (2011.01); B82Y 30/00 (2011.01); B82Y 40/00 (2011.01); C12M 1/34 (2006.01); C12M 3/06 (2006.01); C12N 1/14 (2006.01); C12N 1/20 (2006.01); C12Q 1/02 (2006.01); C12Q 1/6806 (2018.01); C12Q 1/6844 (2018.01); C12Q 1/6848 (2018.01); C12Q 1/686 (2018.01); G01N 15/10 (2024.01); G01N 15/14 (2024.01); G01N 15/1433 (2024.01); G01N 21/29 (2006.01); G01N 21/33 (2006.01); G01N 21/65 (2006.01); G01N 30/02 (2006.01); G01N 30/72 (2006.01); G01N 33/543 (2006.01); G01N 33/557 (2006.01); G01N 33/574 (2006.01); G01N 33/58 (2006.01); G01N 35/00 (2006.01); H05B 45/10 (2020.01);
U.S. Cl.
CPC ...
G01N 35/00584 (2013.01); G01N 21/33 (2013.01); H05B 45/10 (2020.01);
Abstract

Provided is an automatic analysis device capable of obtaining a stable light intensity over a wide wavelength band by multiplexing a plurality of LED lights and adjusting the temperature characteristics of each LED element. The automatic analysis device according to the present disclosure is configured such that light emitted from a second LED is reflected to be multiplexed on the same optical axis as the light emitted from a first LED, and the first LED and the second LED are in contact with the same temperature adjustment member.

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