The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Mar. 03, 2023
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Terizhandur S. Ramakrishnan, Boxborough, MA (US);

Robert O'leary, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01); E21B 49/08 (2006.01); G01N 33/28 (2006.01);
U.S. Cl.
CPC ...
G01N 21/41 (2013.01); E21B 49/081 (2013.01); G01N 33/2823 (2013.01); G01N 33/2841 (2013.01); G01N 2201/0638 (2013.01);
Abstract

Systems and methods presented herein generally relate to a tool for determining a refractive index of a formation fluid using attenuated total reflection. The tool includes a body having a fluid admitting assembly and a flow line that receives the formation fluid. The tool also includes two different crystals having faces in contact with fluid in the flow line. The tool further includes at least one light source coupled to the crystals and configured to direct light into the crystals. In addition, the wavelength, the refractive indices, and the angles of incidence are configured such that the light undergoes total internal reflection at interfaces between the crystals and the formation fluid. The tool also includes at least one light detector coupled to the crystals and configured to measure reflected light exiting the crystals. The tool further includes at least one processor coupled to the at least one light detector.


Find Patent Forward Citations

Ramakrishnan, Terizhandur. (2025). Attenuated total reflection based measurement of refractive index and carbon dioxide concentration (U.S. Patent No. 12436103). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12436103

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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