The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Sep. 13, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Kimi Ikeda, Shizuoka, JP;

Sotaro Inomata, Shizuoka, JP;

Yusuke Sakai, Shizuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/33 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01N 21/33 (2013.01); G01N 21/314 (2013.01); G01N 2021/3166 (2013.01); G01N 2021/3181 (2013.01); G01N 2223/612 (2013.01);
Abstract

With the present invention, it is possible to provide an inspection tool capable of easily inspecting whether or not light which inactivates a virus or the like has been radiated and easily inspecting whether or not light which is harmful to the human body has been radiated. The inspection tool of the present invention includes a first display portion and a second display portion, in which the first display portion is a display portion which indicates a visual change before and after irradiation of the inspection tool with light having at least any of wavelengths in a wavelength range of 200 to 280 nm, and the second display portion is a display portion which does not indicate a visual change before and after irradiation of the inspection tool with light in a wavelength range of 200 to 230 nm, but indicates a visual change before and after irradiation of the inspection tool with light having at least any of wavelengths in a wavelength range of more than 230 nm and 280 nm or less.


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