The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2025

Filed:

Oct. 21, 2021
Applicant:

Dic Corporation, Tokyo, JP;

Inventors:

Akihiro Koike, Sakura, JP;

Yusuke Kano, Sakura, JP;

Assignee:

DIC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C10M 125/22 (2006.01); C01G 39/06 (2006.01); C10M 139/00 (2006.01); C10M 141/12 (2006.01); C10M 169/04 (2006.01); C10N 20/06 (2006.01);
U.S. Cl.
CPC ...
C10M 125/22 (2013.01); C01G 39/06 (2013.01); C10M 139/00 (2013.01); C10M 141/12 (2013.01); C10M 169/04 (2013.01); C01P 2002/60 (2013.01); C01P 2002/72 (2013.01); C01P 2002/74 (2013.01); C01P 2002/76 (2013.01); C01P 2004/61 (2013.01); C01P 2004/62 (2013.01); C01P 2004/64 (2013.01); C01P 2006/12 (2013.01); C10M 2201/066 (2013.01); C10M 2203/003 (2013.01); C10N 2020/06 (2013.01);
Abstract

Molybdenum disulfide particles include a 2H crystal structure and a 3R crystal structure of molybdenum disulfide, in which a presence ratio of the 3R crystal structure in a crystal phase of molybdenum disulfide is 10% or more, and a crystallite size of the 3R crystal structure calculated by extended-type Rietveld analysis based on an analysis formula L=Kλ/(β cos θ) using a profile obtained from powder X-ray diffraction (XRD) using Cu-Kα rays as an X-ray source is 1 nm or more and 150 nm or less (in the above formula, K is an instrumental constant that depends on an XRD optical system (an incident side and a detector side) and settings, L is a crystallite size [m], λ is a measured X-ray wavelength [m], β is a half width [rad], and θ is a Bragg angle of a diffraction line [rad]).


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