The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
Nov. 11, 2021
Longyear Tm, Inc., Salt Lake City, UT (US);
Decision Tree, Llc, Greeley, CO (US);
Brandon Lee Goodchild Drake, Greeley, CO (US);
Ry Nathaniel Zawadzki, Belmont, AU;
DECISION TREE, LLC, Greeley, CO (US);
VERACIO, LTD., Salt Lake City, UT (US);
Abstract
Provided herein are methods and systems for improved material sample analysis and quality control. A computing device may receive sample data associated with a plurality of material samples. The computing device may determine a first subset of the plurality of material samples and a second subset of the plurality of material samples. The computing device may determine the first subset based on a plurality of reference values and a plurality of analysis thresholds. The first subset may include samples associated with acceptable XRF spectra. The second subset may include samples associated with unacceptable XRF spectra. The computing device may generate and manipulate charts, graphs, or other visual displays of the data underlying the first subset and/or the second subset.